JEOL USA will announce a new business relationship and a new class of microscope that will make its debut at Pittcon 2008. You are invited to attend our press conference on Tuesday, March 4, at 3 p.m. in Room 356 to learn more details. Charles Nielsen, Sr. Vice President and SEM Product Manager will present key points on the new microscope and additional new electron optics instruments. Dr. Douglas Meinhart, Director of Analytical Instruments will speak about new applications for open air mass spectrometry and the AutoDART will also be on the agenda.

As you plan your visit to the show, please include a stop by the JEOL USA booth #4120/4121 to see several new instruments we have recently introduced, including the MultiBeam SEM/FIB, the CarryScope mobile Scanning Electron Microscope, the ECS NMR-400 spectrometer, and the new TLC plate analysis capability of the AccuTOF-DART.